Machine learning approaches for improving atomic force microscopy instrumentation and data analytics
1 Electrical and Computer Engineering, Iowa State University, Ames, IA, United States 2 Mechanical Engineering, Iowa State University, Ames, IA, United States Atomic force microscopy (AFM) is a part ...
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Abstract: Data quality is the measure to which data satisfy the demands of its use in accuracy, completeness, consistency, timelines, and reliability. Data quality problems such as missing values, ...
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